Soft Upsets in 16K Dynamic RAMs Induced by Single High Energy Photons
نویسندگان
چکیده
منابع مشابه
ENERGY DEPOSITION MECHANISMS FOR PROTON- AND NEUTRON-INDUCED SINGLE EVENT UPSETS IN MODERN ELECTRONIC DEVICES By
To my children: May you forever feel the need to discover ii ACKNOWLEDGMENTS I am indebted to many people who have helped me over the course of my graduate studies. First and foremost, I would like to express my deep appreciation and love to my wife, Michelle, for her tremendous encouragement and support. Without her, I certainly wouldn't be where I am today. Much of the experimental portion of...
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www.xilinx.com 1 © Copyright 2012 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Occasionally, electronic devices exhibit erroneous behavior for no apparent reason. Through careful exper...
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 1980
ISSN: 0018-9499,1558-1578
DOI: 10.1109/tns.1980.4331061